Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5821766 | Method and apparatus for measuring the metallurgical channel length of a semiconductor device | Sung Ki Kim, Jin-Hyoung Kim, Han-Sub Yoon, Myung-Suk Jo | 1998-10-13 |
| 5252510 | Method for manufacturing a CMOS device having twin wells and an alignment key region | Hyung L. Ji | 1993-10-12 |
| 5066604 | Method for manufacturing a semiconductor device utilizing a self-aligned contact process | In S. Chung | 1991-11-19 |