Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5945349 | Method of enabling analysis of defects of semiconductor device with three dimensions | — | 1999-08-31 |
| 5849642 | Method of fabricating specimen for exposing defects of a semiconductor device for observation and analysis | Doo Jin PARK | 1998-12-15 |
| 5840205 | Method of fabricating specimen for analyzing defects of semiconductor device | Doo Jin PARK | 1998-11-24 |
| 5498871 | Method for analyzing the defectiveness of semiconductor device | Chung-Tae Kim, Song Ju | 1996-03-12 |