Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12134336 | System method for battery diagnosis according to altitude using atmospheric pressure sensor | — | 2024-11-05 |
| 5849642 | Method of fabricating specimen for exposing defects of a semiconductor device for observation and analysis | Jeong-Hoi Koo | 1998-12-15 |
| 5840205 | Method of fabricating specimen for analyzing defects of semiconductor device | Jeong-Hoi Koo | 1998-11-24 |