Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7546146 | Control system and method for diversity antenna system | Daniel F. Sievenpiper, Hui-Pin Hsu, Timothy J. Talty | 2009-06-09 |
| 7400488 | Variable capacitance membrane actuator for wide band tuning of microstrip resonators and filters | Jonathan J. Lynch, Sarabjit Mehta, Peter Petre | 2008-07-15 |
| 7161791 | Variable capacitance membrane actuator for wide band tuning of microstrip resonators and filters | Jonathan J. Lynch, Sarabjit Mehta, Peter Petre | 2007-01-09 |
| 7151350 | Powered door object detection system and method | Ronald H. Haag, Jeremy M. Husic | 2006-12-19 |
| 7085121 | Variable capacitance membrane actuator for wide band tuning of microstrip resonators and filters | Jonathan J. Lynch, Sarabjit Mehta, Peter Petre | 2006-08-01 |
| 6777958 | Method and apparatus for detecting a change in capacitance of a capacitive proximity sensor | Ronald H. Haag | 2004-08-17 |
| 6750624 | Non-contact obstacle detection system utilizing ultra sensitive capacitive sensing | Ronald H. Haag, Brian Deplae, Jeremy M. Husic | 2004-06-15 |
| 6723933 | Flexible capacitive strip for use in a non-contact obstacle detection system | Ronald H. Haag, Brian Deplae, Jeremy M. Husic | 2004-04-20 |
| 6700393 | Capacitive sensor assembly for use in a non-contact obstacle detection system | Ronald H. Haag, Brian Deplae, Jeremy M. Husic | 2004-03-02 |
| 6014108 | Transverse-folded scanning antennas | Jonathan J. Lynch | 2000-01-11 |
| 5872459 | Method of testing integrated circuits | — | 1999-02-16 |
| 5642054 | Active circuit multi-port membrane probe for full wafer testing | — | 1997-06-24 |
| 5623214 | Multiport membrane probe for full-wafer testing | — | 1997-04-22 |
| 5600256 | Cast elastomer/membrane test probe assembly | Blake F. Woith, William R. Crumly, Robert K. Betz | 1997-02-04 |
| 5412866 | Method of making a cast elastomer/membrane test probe assembly | Blake F. Woith, William R. Crumly, Robert K. Betz | 1995-05-09 |
| 5313157 | Probe for jesting an electrical circuit chip | — | 1994-05-17 |
| 5148103 | Apparatus for testing integrated circuits | — | 1992-09-15 |
| 4803644 | Alignment mark detector for electron beam lithography | James Frazier, Oberdan Otto | 1989-02-07 |