Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11662197 | Rapid measurement method for ultra-thin film optical constant | Honggang Gu, Shiyuan Liu, Simin Zhu, Baokun Song, Hao Jiang | 2023-05-30 |
| 11644413 | Method for measuring dielectric tensor of material | Honggang Gu, Baokun Song, Shiyuan Liu, Zhengfeng Guo, Mingsheng Fang +1 more | 2023-05-09 |
| 11619883 | Snapshot type overlay error measuring device and measuring method | Shiyuan Liu | 2023-04-04 |
| 11143804 | Optimization methods of polarization modulator and polarization measurement system | Honggang Gu, Shiyuan Liu, Hao Jiang, Chuanwei Zhang | 2021-10-12 |
| 10983007 | Material optical transition analysis method and system | Honggang Gu, Baokun Song, Shiyuan Liu, Mingsheng Fang, Hao Jiang | 2021-04-20 |
| 10739251 | High temporal resolution Mueller matrix elliptical polarization measuring device and method | Hao Jiang, Jiamin Liu, Shiyuan Liu, Song Zhang, Zhicheng Zhong +1 more | 2020-08-11 |
| 10345568 | Mueller-matrix microscope and measurement and calibration methods using the same | Jun Chen, Chao-Nan Chen, Shiyuan Liu | 2019-07-09 |
| 9103667 | Alignment method for optical axes of composite waveplate | Shiyuan Liu, Honggang Gu, Chuanwei Zhang, Weiqi Li, Weichao Du | 2015-08-11 |
| 9070091 | Method for extracting critical dimension of semiconductor nanostructure | Shiyuan Liu, Jinlong Zhu, Chuanwei Zhang | 2015-06-30 |