Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12411328 | Method for ptychography position correction based on probe weighting | Honggang Gu, Lei Zhong, Li Liu | 2025-09-09 |
| 11818955 | Method for forming piezoelectric films on surfaces of arbitrary morphologies | Zhengbao Yang | 2023-11-14 |
| 11687697 | Method and system for correcting lithography process hotspots based on stress damping adjustment | Haiqing Wei, Hao Jiang | 2023-06-27 |
| 11662197 | Rapid measurement method for ultra-thin film optical constant | Honggang Gu, Simin Zhu, Baokun Song, Hao Jiang, Xiuguo Chen | 2023-05-30 |
| 11644413 | Method for measuring dielectric tensor of material | Honggang Gu, Baokun Song, Zhengfeng Guo, Mingsheng Fang, Hao Jiang +1 more | 2023-05-09 |
| 11619883 | Snapshot type overlay error measuring device and measuring method | Xiuguo Chen | 2023-04-04 |
| 11372146 | Method and device for real-time attitude angle measurement based on field of view effect of birefringent crystal | Hao Jiang, Song Zhang, Honggang Gu | 2022-06-28 |
| 11143804 | Optimization methods of polarization modulator and polarization measurement system | Honggang Gu, Xiuguo Chen, Hao Jiang, Chuanwei Zhang | 2021-10-12 |
| 10983007 | Material optical transition analysis method and system | Honggang Gu, Baokun Song, Mingsheng Fang, Xiuguo Chen, Hao Jiang | 2021-04-20 |
| 10739251 | High temporal resolution Mueller matrix elliptical polarization measuring device and method | Hao Jiang, Jiamin Liu, Song Zhang, Zhicheng Zhong, Xiuguo Chen +1 more | 2020-08-11 |
| 10345568 | Mueller-matrix microscope and measurement and calibration methods using the same | Xiuguo Chen, Jun Chen, Chao-Nan Chen | 2019-07-09 |
| 9785047 | Method and device for measuring large-area and massive scattered field in nanoscale | Weichao Du, Chuanwei Zhang, Yinyin Tan | 2017-10-10 |
| 9103667 | Alignment method for optical axes of composite waveplate | Honggang Gu, Xiuguo Chen, Chuanwei Zhang, Weiqi Li, Weichao Du | 2015-08-11 |
| 9070091 | Method for extracting critical dimension of semiconductor nanostructure | Jinlong Zhu, Chuanwei Zhang, Xiuguo Chen | 2015-06-30 |