Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12235209 | Device and method for measuring the profile of flat objects comprising unknown materials | — | 2025-02-25 |
| 12025424 | Device and method for measuring height profiles on an object | — | 2024-07-02 |
| 10132612 | Method and assembly for determining the thickness of a layer in a sample stack | Stanislas Flon | 2018-11-20 |
| 9671602 | Measurement method for height profiles of surfaces using a differential interference contrast image | Christine Schmidt, Ralf Langhans | 2017-06-06 |
| 9646372 | Inspection apparatus | — | 2017-05-09 |
| 9587930 | Method and assembly for determining the thickness of a layer in a sample stack | — | 2017-03-07 |
| 9500582 | Method for detecting buried layers | Ralf Langhans | 2016-11-22 |
| 9217633 | Inspection arrangement | Ralf Langhans | 2015-12-22 |
| 9176070 | Inspection assembly | — | 2015-11-03 |
| 8837807 | Inspection method with color correction | Marko Doring | 2014-09-16 |
| 8817089 | Inspection system | Marko Doring | 2014-08-26 |
| 7265571 | Method and device for determining a characteristic of a semiconductor sample | — | 2007-09-04 |
| 6526372 | Method and device for determining the dependence of a first measuring quantity on a second measuring quantity | Benno Orschel, Jan Helm | 2003-02-25 |