Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7589322 | Sample measuring device | Kentaro Nishikata, Shigeru Kakinuma, Junichi Aoyama, Satoshi Ohashi | 2009-09-15 |
| 6714301 | Spectral ellipsometer without chromatic aberrations | Kunio Otsuki | 2004-03-30 |