Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6795185 | Film thickness measuring apparatus | Tomoya Yoshizawa | 2004-09-21 |
| 6714301 | Spectral ellipsometer without chromatic aberrations | Yutaka Saijo | 2004-03-30 |
| 5381212 | Photoreceptor for electrophotography | Teruhiko Noguchi, Hiroshi Kinashi, Jitsuo Masuda, Katsushi Inoue, Tatsuo Tanaka +1 more | 1995-01-10 |
| 4969177 | X-ray irradiation apparatus provided with irradiation range monitor | Yoshihiko Usui | 1990-11-06 |
| 4594004 | Continuous particulate-measuring apparatus using an optoacoustic effect | Kozo Ishida, Junji Okayama | 1986-06-10 |