Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10900905 | Probe manufacturing method and probe | Masayuki Nishi, Kazuyuki Hirao, Daisuke Teranishi, Hiroki Itasaka, Yoshito Okuno +2 more | 2021-01-26 |
| 7668668 | Stress component measurement method | Shinsuke Kashiwagi | 2010-02-23 |
| 7623223 | Stress measurement method | Shinsuke Kashiwagi | 2009-11-24 |
| 7327444 | Substrate inspection apparatus and method | Akihiro Katanishi, Masaaki Magari, Yoshiyuki Nakajima, Kimihiko Arimoto | 2008-02-05 |
| 7295307 | Method of and apparatus for measuring stress of semiconductor material | Akihiro Katanishi, Masaaki Magari | 2007-11-13 |