Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5796475 | Signal process method and apparatus for defect inspection | Toyoki Kanzaki | 1998-08-18 |
| 5337140 | Optical detecting system wtih self-correction | Takashi Hagiwara, Toyoki Kanzaki | 1994-08-09 |
| 5321495 | Optical detecting system for determining particle position on a substrate | Takashi Hagiwara, Minoru Taniguchi | 1994-06-14 |
| 4437058 | Indicating means for measuring instrument | — | 1984-03-13 |