Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8310675 | System and process for analyzing a sample | Pascal Amary, Denis Cattelan | 2012-11-13 |
| 7184145 | Achromatic spectroscopic ellipsometer with high spatial resolution | Pascal Amary, Francis Bos, Denis Cattelan | 2007-02-27 |
| 5666200 | Method of ellipsometric measurement, an ellipsometer and device for controlling the carrying out of layers using such method and apparatus | Bernard Drevillon, Morten Kildemo | 1997-09-09 |