Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9366694 | Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample | Marc Chaigneau, Akli Karar, Razvigor Ossikovski | 2016-06-14 |
| 8405830 | Device and method for taking spectroscopic polarimetric measurements in the visible and near-infrared ranges | Denis Cattelan, Enric Garcia-Caurel, Antonello De Martino | 2013-03-26 |
| 8214024 | Electronic polarimetric imaging system for a colposcopy device and an adapter housing | Antonello De Martino, Laurent Schwartz, André NAZAC, Bernard Huynh | 2012-07-03 |
| 7863113 | Transistor for active matrix display and a method for producing said transistor | Pere Roca I Cabarrocas, Regis Vanderhaghen | 2011-01-04 |
| 7859661 | Polarimetric Raman system and method for analysing a sample | Razvigor Ossikovski, Antonello De Martino | 2010-12-28 |
| 7777880 | Metrological characterisation of microelectronic circuits | Antonello De Martino | 2010-08-17 |
| 7713779 | Photoactive nanocomposite and method for the production thereof | Muriel Firon, Anna Fontcuberta i Morral, Serge Palacin, Pere Roca I Cabarrocas | 2010-05-11 |
| 7298480 | Broadband ellipsometer / polarimeter system | Enric Garcia-Caurel, Antonello De Martino | 2007-11-20 |
| 7196792 | Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process | Antonello De Martino | 2007-03-27 |
| 7046379 | Method for characterizing or controlling the production of a thin-layered component using optical methods | Alfred Hofrichter, Dmitri L. Kouznetsov | 2006-05-16 |
| 6914675 | Ellipsometric method and control device for making a thin-layered component | — | 2005-07-05 |
| 6868312 | Method for real-time control of the fabrication of a thin-film structure by ellipsometric measurement | Thibaut Heitz, Jean-Christophe Rostaing | 2005-03-15 |
| 6657708 | Apparatus for optically characterising thin layered material | Edouard Da Silva, Benferhat Ramdane | 2003-12-02 |
| 6613434 | Method for treating polymer surface | Pavel Bulkine, Alfred Hofrichter | 2003-09-02 |
| 6561198 | Method and installation for treating a metal part surface | Nicolas Bertrand, Jean-Christophe Rostaing | 2003-05-13 |
| 6177995 | Polarimeter and corresponding measuring method | Eric Compain | 2001-01-23 |
| 6175412 | Optical component for polarization modulation, a mueller polarimeter and ellipsometer containing such an optical component, a process for the calibration of this ellipsometer, and an ellipsometric measurement process | Eric Compain | 2001-01-16 |
| 5757671 | Multi-detector ellipsometer and process of multi-detector ellipsometric measurement | Jean-Yves Parey | 1998-05-26 |
| 5666200 | Method of ellipsometric measurement, an ellipsometer and device for controlling the carrying out of layers using such method and apparatus | Morten Kildemo, Ramdane Benferhat | 1997-09-09 |
| 5536936 | Spectroscopic ellipsometer modulated by an external excitation | Jean-Yves Parey, Razvigor Ossikovski | 1996-07-16 |
| 5485271 | Dual-modulation interferometric ellipsometer | Adolfo C. Biosca | 1996-01-16 |