BL

Bradley J. Larsen

HO Honeywell: 8 patents #1,328 of 14,447Top 10%
AT Atmel: 7 patents #111 of 762Top 15%
AS Aeroflex Utmc Microelectronics Systems: 1 patents #7 of 11Top 65%
📍 Woodland Park, CO: #3 of 133 inventorsTop 3%
🗺 Colorado: #2,621 of 40,980 inventorsTop 7%
Overall (All Time): #299,407 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
8759903 Method of fabricating total dose hard and thermal neutron hard integrated circuits Michael S. Liu, David James Swanson 2014-06-24
8399845 Neutron detector cell efficiency Paul S. Fechner, David O. Erstad, Todd A. Randazzo 2013-03-19
8310021 Neutron detector with wafer-to-wafer bonding Todd A. Randazzo 2012-11-13
8153985 Neutron detector cell efficiency Todd A. Randazzo, Paul S. Fechner 2012-04-10
7964897 Direct contact to area efficient body tie process flow Paul S. Fechner, Gregor D. Dougal, Keith Golke 2011-06-21
7679139 Non-planar silicon-on-insulator device that includes an “area-efficient” body tie Michael S. Liu, Paul S. Fechner 2010-03-16
7378705 Single-poly EEPROM cell with lightly doped MOS capacitors James E. Riekels, Thomas Lucking, Gary Gardner 2008-05-27
7177489 Silicon-insulator-silicon thin-film structures for optical modulators and methods of manufacture Thomas Keyser, Cheisan Yue 2007-02-13
6890832 Radiation hardening method for shallow trench isolation in CMOS David B. Kerwin 2005-05-10
6828212 Method of forming shallow trench isolation structure in a semiconductor device Timothy Mark Barry, Nicolas Degors, Donald A. Erickson, Amit S. Kelkar 2004-12-07
RE36777 Integration of high performance submicron CMOS and dual-poly non-volatile memory devices using a third polysilicon layer Todd A. Randazzo, Donald A. Erickson 2000-07-11
5583380 Integrated circuit contacts with secured stringers Kurt Schertenleib 1996-12-10
5493142 Input/output transistors with optimized ESD protection Todd A. Randazzo, Geoffrey S. Gongwer 1996-02-20
5440159 Single layer polysilicon EEPROM having uniform thickness gate oxide/capacitor dielectric layer Todd A. Randazzo, Geoffrey S. Gongwer 1995-08-08
5352618 Method for forming thin tunneling windows in EEPROMs Donald A. Erickson 1994-10-04
5340764 Integration of high performance submicron CMOS and dual-poly non-volatile memory devices using a third polysilicon layer Todd A. Randazzo, Donald A. Erickson 1994-08-23