| 8576634 |
Semiconductor device comprising a memory cell group having a gate width larger than a second memory cell group |
Fumitoshi Ito, Yoshiyuki Kawashima, Takeshi Sakai, Yasushi Ishii, Takashi Hashimoto +3 more |
2013-11-05 |
| 7721599 |
Reduced resistance thermal flow measurement device |
Masahiro Matsumoto, Hiroshi Nakano, Masamichi Yamada, Keiji Hanzawa, Izumi Watanabe +1 more |
2010-05-25 |
| 7719052 |
Semiconductor device |
Fumitoshi Ito, Yoshiyuki Kawashima, Takeshi Sakai, Yasushi Ishii, Takashi Hashimoto +3 more |
2010-05-18 |
| 7617723 |
Thermal type flow rate measuring apparatus having decrease in coupling capacitance between wiring portions of detection element |
Masahiro Matsumoto, Masamichi Yamada, Hiroshi Nakano, Keiji Hanzawa |
2009-11-17 |
| 7472591 |
Thermal gas flow and control device for internal-combustion engine using the same |
Keiji Hanzawa |
2009-01-06 |
| 7349250 |
Semiconductor device |
Fumitoshi Ito, Yoshiyuki Kawashima, Takeshi Sakai, Yasushi Ishii, Takashi Hashimoto +3 more |
2008-03-25 |
| 7087955 |
Semiconductor device and a method of manufacturing the same |
Yoshiyuki Kawashima, Fumitoshi Ito, Takeshi Sakai, Yasushi Ishii, Takashi Hashimoto +2 more |
2006-08-08 |