Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8695110 | Scanning probe microscope and sample observing method using the same | Toshihiko Nakata, Masahiro Watanabe, Takashi Inoue, Kishio Hidaka | 2014-04-08 |
| 8635710 | Scanning probe microscope and method of observing sample using the same | Toshihiko Nakata, Masahiro Watanabe, Takashi Inoue, Kishio Hidaka, Makoto Okai +1 more | 2014-01-21 |
| 8476739 | Graphene grown substrate and electronic/photonic integrated circuits using same | Makoto Okai, Takashi Kyotani, Hironori Orikasa | 2013-07-02 |
| 8471237 | Circuit board including a graphene film having contact region covering a recessed region and a patterned metal film covering the contact region and in direct electrical contact therewith, and device including same | Makoto Okai, Yasuo Wada | 2013-06-25 |
| 8438660 | Micro contact prober | Makoto Okai | 2013-05-07 |
| 8410474 | Graphene grown substrate and electronic/photonic integrated circuits using same | Makoto Okai, Yasuo Wada | 2013-04-02 |
| 8407811 | Scanning probe microscope and method of observing sample using the same | Toshihiko Nakata, Masahiro Watanabe, Takashi Inoue, Kishio Hidaka, Makoto Okai | 2013-03-26 |
| 8278658 | Electrically connected graphene-metal electrode device, and electronic device, electronic integrated circuit and electro-optical integrated circuit using same | Makoto Okai | 2012-10-02 |
| 8272068 | Scanning probe microscope and sample observing method using the same | Toshihiko Nakata, Masahiro Watanabe, Takashi Inoue, Kishio Hidaka | 2012-09-18 |
| 8181268 | Scanning probe microscope and method of observing sample using the same | Toshihiko Nakata, Masahiro Watanabe, Takashi Inoue, Kishio Hidaka, Makoto Okai +1 more | 2012-05-15 |
| 7976950 | Transparent conductive film and electronic device including same | Makoto Okai | 2011-07-12 |