Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10664370 | Multiple core analysis mode for defect analysis | Yoshihide Nakamura, Takuya LEE, Yutaka Nakadai, Tetsuya Kokubun, Hiroyuki Sasaki | 2020-05-26 |
| 10656201 | Semiconductor device | Takuya LEE, Tetsuya Kokubun, Yutaka Nakadai, Yoshihide Nakamura | 2020-05-19 |
| 6753231 | Semiconductor integrated circuit and method for manufacturing the same | Shuji Ikeda, Yasuko Yoshida, Masayuki Kojima, Mitsuyuki Kimura, Norio Nakagawa +4 more | 2004-06-22 |
| 6559006 | Semiconductor integrated circuit and method for manufacturing the same | Shuji Ikeda, Yasuko Yoshida, Masayuki Kojima, Mitsuyuki Kimura, Norio Nakagawa +4 more | 2003-05-06 |
| 6436753 | Semiconductor integrated circuit and method for manufacturing the same | Shuji Ikeda, Yasuko Yoshida, Masayuki Kojima, Mitsuyuki Kimura, Norio Nakagawa +4 more | 2002-08-20 |