Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4952272 | Method of manufacturing probing head for testing equipment of semi-conductor large scale integrated circuits | Akio Fujiwara, Yutaka Akiba, Susumu Kasukabe, Tsuyoshi Fujita, Masao Mitani +1 more | 1990-08-28 |