Issued Patents All Time
Showing 51–66 of 66 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7375409 | Semiconductor device including transistors having different drain breakdown voltages on a single substrate | — | 2008-05-20 |
| 7238995 | Semiconductor device and method of manufacturing the same | — | 2007-07-03 |
| D545309 | Computer | Hiroyuki Noda, Tadahiro Yamaguchi, Koji Suso, Shinichiro Aikawa | 2007-06-26 |
| D541277 | Monitor for a computer | Hiroyuki Noda, Tadahiro Yamaguchi, Koji Suso, Masao Miyawaki | 2007-04-24 |
| D540320 | Computer | Hiroyuki Noda, Tadahiro Yamaguchi, Koji Suso, Kazuyuki Fukushima, Keisuke Nakayama | 2007-04-10 |
| D524810 | Computer | Hiroyuki Noda, Tadahiro Yamaguchi, Koji Suso, Kazuyuki Fukushima, Shinichiro Aikawa | 2006-07-11 |
| D522503 | Computer | Hiroyuki Noda, Tadahiro Yamaguchi, Koji Suso, Kazuma Kishi, Daichi Hotta | 2006-06-06 |
| D517064 | Computer | Hiroyuki Noda, Tadahiro Yamaguchi, Koji Suso, Kazuyuki Fukushima, Shinichiro Aikawa | 2006-03-14 |
| D516557 | Monitor for a computer | Hiroyuki Noda, Tadahiro Yamaguchi, Koji Suso, Masao Miyawaki | 2006-03-07 |
| 6709908 | Methods for making semiconductor devices | Akihiko Ebina | 2004-03-23 |
| 6603175 | Operating circuit with voltage regular circuit having at least a partially depleted soi field effect transistor | Tadao Kadowaki, Akihiko Ebina, Masayuki Yamaguchi | 2003-08-05 |
| D429401 | Kiosk | Yukio Kuroiwa, Tohru Higashihara, Shinichi Sarugaku, Akira Fujishiro, Kazuyuki Terashima | 2000-08-08 |
| 5999005 | Voltage and displacement measuring apparatus and probe | Akira Fujii, Soichi Hama, Kazuyuki Ozaki, Yoshiro Goto, Yasutoshi Umehara +1 more | 1999-12-07 |
| 5940274 | Casing for computer and computer employing the same casing with removable rear cable cover | Takashi Yamamoto, Tohru Higashihara, Hideki Iwao, Ichirou Asano | 1999-08-17 |
| 5677635 | Voltage and displacement measuring apparatus and probe | Akira Fujii, Soichi Hama, Kazuyuki Ozaki, Yoshiro Goto, Yasutoshi Umehara +1 more | 1997-10-14 |
| 5331275 | Probing device and system for testing an integrated circuit | Kazuyuki Ozaki, Shinichi Wakana, Yoshiro Goto, Akio Ito, Kazuo Okubo +2 more | 1994-07-19 |