Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9792832 | Charged particle beam apparatus, specimen observation system and operation program | Yayoi Konishi, Hiroyuki Noda, Takahiro Inada, Kunji Shigeto, Tohru Ando +2 more | 2017-10-17 |
| 9058957 | Charged particle beam apparatus | Kunji Shigeto, Mitsugu Sato, Noriko Iizumi, Hiroyuki Noda, Masako Nishimura +3 more | 2015-06-16 |
| 6657193 | Scanning electron microscope | Yukari Dan, Mitsugu Sato | 2003-12-02 |