Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11791130 | Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device | Koichi Hamada, Megumi Kimura, Momoyo Enyama, Ryou YUMIBA, Makoto Sakakibara +4 more | 2023-10-17 |
| 9679744 | Charged particle beam apparatus and method of correcting landing angle of charged particle beam | — | 2017-06-13 |
| 9129353 | Charged particle beam device, and image analysis device | Osamu Komuro | 2015-09-08 |