RW

Ron B. Whitney

HT High Yield Technology: 1 patents #8 of 16Top 50%
Overall (All Time): #3,824,326 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5212580 Low cost stage for raster scanning of semiconductor wafers George L. Coad, James B. Stolz, Yung-Chao Lee, Peter G. Borden, Mark Nokes 1993-05-18