TL

Tsung-Po Lee

HS Hermes Testing Solutions: 1 patents #4 of 13Top 35%
Overall (All Time): #2,594,895 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
11703524 Probing system for discrete wafer Wen-Yuan Hsu, Chi-Ming Yang, Sih-Ying Chang, Kee-Leong Yu 2023-07-18