Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12150265 | SSD card adapter bracket and circuit board assembly | Yi-Sheng Lin | 2024-11-19 |
| 12026023 | Support assembly and chassis structure having the same | Yi-Sheng Lin | 2024-07-02 |
| 11900487 | Method and system of processing vehicle charging information | Charlie Fang, Aaron Nojima, Fuxing Luan, William Chien-Yeh Lee, Meng Xie +3 more | 2024-02-13 |
| 11880971 | Inspection method and system | Wei Fang, Jack Jau | 2024-01-23 |
| 11250559 | Inspection method and system | Wei Fang, Jack Jau | 2022-02-15 |
| 10679340 | Inspection method and system | Wei Fang, Jack Jau | 2020-06-09 |
| 10102619 | Inspection method and system | Wei Fang, Jack Jau | 2018-10-16 |
| 9965844 | Inspection method and system | Wei Fang, Jack Jau | 2018-05-08 |
| 9251581 | Methods for promoting semiconductor manufacturing yield and classifying defects during fabricating a semiconductor device, and computer readable mediums encoded with a computer program implementing the same | Shih-Tsung Chen, Wei Fang, Yu Fu, Futang Peng | 2016-02-02 |
| 8805054 | Method and system of classifying defects on a wafer | Wei Fang, Jack Jau | 2014-08-12 |
| 8712184 | Method and system for filtering noises in an image scanned by charged particles | Chad Liao, Futang Peng, Chuan Li, Alina Wang, Wei Fang +1 more | 2014-04-29 |
| 8606017 | Method for inspecting localized image and system thereof | Wei Fang, Jack Jau | 2013-12-10 |
| 8068662 | Method and system for determining a defect during charged particle beam inspection of a sample | Wei Fang, Jack Jau | 2011-11-29 |