Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6908775 | Method for performing an alignment measurement of two patterns in different layers on a semiconductor wafer | Sebastian Schmidt, Thorsten Schedel | 2005-06-21 |
| 4395037 | Apparatus for stacking textile fabric sheets on top of one another | — | 1983-07-26 |
| 4284462 | Automatic stacking apparatus for variable length textile fabrics | — | 1981-08-18 |