Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9880329 | Optical mirror, X-ray fluorescence analysis device, and method for X-ray fluorescence analysis | — | 2018-01-30 |
| 7076021 | Apparatus for measurement of the thickness of thin layers | Helmut Fischer | 2006-07-11 |
| 6438209 | Apparatus for guiding X-rays | — | 2002-08-20 |
| 6370221 | Method of setting a position of an object of measurement in layer thickness measurement by X-ray fluorescence | Karl-Heinz Kaiser | 2002-04-09 |
| 6364528 | Determination of the measuring spot during x-ray fluorescence analysis | — | 2002-04-02 |
| 6038280 | Method and apparatus for measuring the thicknesses of thin layers by means of x-ray fluorescence | Karl-Heinz Kaiser | 2000-03-14 |