XC

Xiuhai Cui

HT Harbin Institute Of Technology: 2 patents #54 of 455Top 15%
Overall (All Time): #1,723,754 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12352708 Detection method for the radiation-induced defects of oxide layer in electronic devices Xingji Li, Jianqun Yang, Xiaodong Xu, Gang Lv, Tao Ying +1 more 2025-07-08
12153082 Detection method for sensitive parts of ionization damage in bipolar transistor Xingji Li, Jianqun Yang, Gang Lv, Yadong Wei, Xiaodong Xu +1 more 2024-11-26