Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12352708 | Detection method for the radiation-induced defects of oxide layer in electronic devices | Jianqun Yang, Xiaodong Xu, Gang Lv, Xiuhai Cui, Tao Ying +1 more | 2025-07-08 |
| 12153082 | Detection method for sensitive parts of ionization damage in bipolar transistor | Jianqun Yang, Gang Lv, Yadong Wei, Xiaodong Xu, Tao Ying +1 more | 2024-11-26 |