Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002792 | Semiconductor device inspection system | Shigehisa Oguri, Eiji Inuzuka, Kouji Suzuki, Wataru Nagata | 1999-12-14 |
| 5532607 | Semiconductor device inspection system involving superimposition of image data for detecting flaws in the semiconductor device | Eiji Inuzuka, Shigehisa Oguri, Kouji Suzuki, Wataru Nagata | 1996-07-02 |