Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002792 | Semiconductor device inspection system | Shigehisa Oguri, Kouji Suzuki, Wataru Nagata, Yasushi Hiruma | 1999-12-14 |
| 5532607 | Semiconductor device inspection system involving superimposition of image data for detecting flaws in the semiconductor device | Shigehisa Oguri, Kouji Suzuki, Wataru Nagata, Yasushi Hiruma | 1996-07-02 |
| 5227638 | Method and apparatus for evaluating luminous efficiency | Yoshihiko Mizushima, Takashi Iida | 1993-07-13 |
| 5136373 | Image processing apparatus | Kiyoshi Kamiya, Masahumi Oshiro, Shigeru Uchiyama, Koji Suzuki | 1992-08-04 |
| 4602282 | Measuring devices for two-dimensional photon-caused or corpuscular-ray-caused image signals | Takehiro Kurono, Yutaka Tsuchiya, Teruo Hiruma | 1986-07-22 |
| 4492879 | Trigger circuit | Yutaka Tsuchiya, Yuji Shinoda | 1985-01-08 |