KS

Katsumi Shibayama

HK Hamamatsu Photonics K.K.: 234 patents #1 of 1,436Top 1%
Overall (All Time): #1,815 of 4,157,543Top 1%
259
Patents All Time

Issued Patents All Time

Showing 76–100 of 259 patents

Patent #TitleCo-InventorsDate
D884505 Infrared detector Masahiro Yamazaki, Ryusuke Kitaura 2020-05-19
D884504 Infrared detector Masahiro Yamazaki, Ryusuke Kitaura 2020-05-19
D884503 Infrared detector Masahiro Yamazaki, Ryusuke Kitaura 2020-05-19
10656094 Surface-enhanced Raman scattering unit Masashi Ito, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama 2020-05-19
D883117 Spectrometer Takafumi Yokino, Katsuhiko Kato 2020-05-05
D883116 Spectrometer Takafumi Yokino, Katsuhiko Kato 2020-05-05
10622403 Semiconductor device manufacturing method Noburo Hosokawa, Nao Inoue 2020-04-14
10622402 Semiconductor device Noburo Hosokawa, Nao Inoue 2020-04-14
D880323 Spectrometer Takafumi Yokino, Katsuhiko Kato 2020-04-07
10615220 Semiconductor device and manufacturing method thereof Noburo Hosokawa, Nao Inoue 2020-04-07
D878226 Spectrometer Takafumi Yokino, Katsuhiko Kato 2020-03-17
10591715 Fabry-Perot interference filter Takashi Kasahara, Masaki Hirose, Toshimitsu Kawai 2020-03-17
10551322 Surface-enhanced Raman scattering unit including integrally formed handling board Masashi Ito, Toshimitsu Kawai, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama +3 more 2020-02-04
10539461 Spectroscope Takafumi Yokino, Katsuhiko Kato 2020-01-21
10480999 Spectroscope and method for producing spectroscope Takafumi Yokino 2019-11-19
10408677 Spectroscope, and spectroscope production method Takafumi Yokino, Katsuhiko Kato 2019-09-10
10408761 Surface-enhanced Raman scattering element Masashi Ito, Takafumi Yokino, Masaki Hirose, Toshimitsu Kawai, Kazuto Ofuji +1 more 2019-09-10
10403676 Semiconductor device manufacturing method Noburo Hosokawa, Nao Inoue 2019-09-03
10393663 Surface-enhanced raman scattering element and method for manufacturing same Masashi Ito, Kazuto Ofuji, Hiroki Oyama, Yoshihiro Maruyama, Nao Inoue 2019-08-27
10386552 Optical element, and method for producing same Takafumi Yokino, Katsuhiko Kato 2019-08-20
D855207 Substrate for spectroscopic analysis Masashi Ito, Kazuto Ofuji, Yoshihiro Maruyama 2019-07-30
D855208 Substrate for spectroscopic analysis Masashi Ito, Kazuto Ofuji, Yoshihiro Maruyama 2019-07-30
D855206 Substrate for spectroscopic analysis Masahi Ito, Kazuto Ofuji, Yoshihiro Maruyama 2019-07-30
D855209 Substrate for spectroscopic analysis Masashi Ito, Kazuto Ofuji, Yoshihiro Maruyama 2019-07-30
D855205 Substrate for spectroscopic analysis Masashi Ito, Kazuto Ofuji, Yoshihiro Maruyama 2019-07-30