Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11275312 | Systems and methods for verifying photomask cleanliness | James Dunphy, Hongqin Shi, David Hutchison, Yeh-Jiun Tung, Nao S. Chuei | 2022-03-15 |
EC
Eric Copenhaver
Overall (All Time): #2,643,001 of 4,157,543Top 65%
1
Patents All Time