JL

James Chingwei Li

General Motors: 22 patents #572 of 18,328Top 4%
HL Hrl Laboratories: 18 patents #88 of 709Top 15%
RL Rockwell Scientific Licensing: 5 patents #4 of 52Top 8%
IL Innovative Technology Licensing: 3 patents #5 of 57Top 9%
TL Teledyne Licensing: 1 patents #35 of 70Top 50%
📍 Simi Valley, CA: #19 of 1,200 inventorsTop 2%
🗺 California: #7,932 of 386,348 inventorsTop 3%
Overall (All Time): #54,056 of 4,157,543Top 2%
50
Patents All Time

Issued Patents All Time

Showing 26–50 of 50 patents

Patent #TitleCo-InventorsDate
9537514 High oversampling ratio dynamic element matching scheme for high dynamic range digital to RF data conversion for cellular communications Timothy J. Talty, Zhiwei Xu, Mohiuddin Ahmed, Cynthia D. Baringer, Albert E. Cosand +2 more 2017-01-03
9531571 Agile radio architecture Zhiwei Xu, Yen-Cheng Kuan, Donald A. Hitko, Joseph F. Jensen 2016-12-27
9515068 Monolithic integration of GaN and InP components Pamela R. Patterson, Keisuke Shinohara, Hasan Sharifi, Wonill Ha, Tahir Hussain +1 more 2016-12-06
9508552 Method for forming metallic sub-collector for HBT and BJT transistors Donald A. Hitko, Yakov Royter, Pamela R. Patterson 2016-11-29
9383266 Test structure to monitor the in-situ channel temperature of field effect transistors Tahir Hussain 2016-07-05
9099397 Fabrication of self aligned base contacts for bipolar transistors 2015-08-04
9087854 Thermal management for heterogeneously integrated technology Wonill Ha, Hasan Sharifi, Tahir Hussain, Pamela R. Patterson 2015-07-21
8957455 Modulation doped super-lattice base for heterojunction bipolar transistors Marko Sokolich, Tahir Hussain, David H. Chow 2015-02-17
8860092 Metallic sub-collector for HBT and BJT transistors Donald A. Hitko, Yakov Royter, Pamela R. Patterson 2014-10-14
8587037 Test structure to monitor the in-situ channel temperature of field effect transistors Tahir Hussain 2013-11-19
8575659 Carbon-beryllium combinationally doped semiconductor Steven S. Bui, Tahir Hussain 2013-11-05
8178946 Modulation doped super-lattice base for heterojunction bipolar transistors Marko Sokolich, Tahir Hussain, David H. Chow 2012-05-15
7868335 Modulation doped super-lattice sub-collector for high-performance HBTs and BJTs Marko Sokolich, Tahir Hussain, David H. Chow 2011-01-11
7582536 Electronic device with reduced interface charge between epitaxially grown layers and a method for making the same Rajesh D. Rajavel, Mary Y. Chen, Steven S. Bui, David H. Chow, Mehran Mokhtari +1 more 2009-09-01
7531851 Electronic device with reduced interface charge between epitaxially grown layers and a method for making the same Rajesh D. Rajavel, Mary Y. Chen, Steven S. Bui, David H. Chow, Mehran Mokhtari +1 more 2009-05-12
7470619 Interconnect with high aspect ratio plugged vias Mary Y. Chen, Philip H. Lawyer, Marko Sokolich 2008-12-30
7354820 Heterojunction bipolar transistor with dielectric assisted planarized contacts and method for fabricating Richard L. Pierson, Jr., Berinder Brar, John A. Higgins 2008-04-08
6958491 Bipolar transistor test structure with lateral test probe pads Berinder Brar, John A. Higgins 2005-10-25
6949776 Heterojunction bipolar transistor with dielectric assisted planarized contacts and method for fabricating Richard L. Pierson, Jr., Berinder Brar, John A. Higgins 2005-09-27
6870184 Mechanically-stable BJT with reduced base-collector capacitance Richard L. Pierson, Jr., Berinder Brar, John A. Higgins 2005-03-22
6858887 BJT device configuration and fabrication method with reduced emitter width Richard L. Pierson, Jr., Berinder Brar, John A. Higgins 2005-02-22
6815237 Testing apparatus and method for determining an etch bias associated with a semiconductor-processing step Richard L. Pierson, Jr., Berinder Brar 2004-11-09
6800531 Method of fabricating a bipolar transistor Richard L. Pierson, Jr., Berinder Brar, John A. Higgins 2004-10-05
6797995 Heterojunction bipolar transistor with InGaAs contact and etch stop layer for InP sub-collector Richard L. Pierson, Jr., Berinder Brar, John A. Higgins 2004-09-28
6605825 Bipolar transistor characterization apparatus with lateral test probe pads Berinder Brar, John A. Higgins 2003-08-12