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Yuta NAGAI

GC Globalwafers Japan Co.: 1 patents #21 of 44Top 50%
Overall (All Time): #2,864,730 of 4,157,543Top 70%
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Patent #TitleCo-InventorsDate
10330599 Calibration curve determination method, carbon concentration measurement method, and silicon wafer-manufacturing method Satoko Nakagawa 2019-06-25