Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12385850 | Semiconductor wafers using front-end processed wafer global geometry metrics | Yung Hsing Chu, Yen-Chun Chou | 2025-08-12 |
| 12227874 | Methods for determining suitability of Czochralski growth conditions for producing substrates for epitaxy | Zheng Lu, Chun-Chin Tu, Chi-Yung Chen, Feng-Chien Tsai, Hong-Huei Huang | 2025-02-18 |
| 12152314 | Methods for determining suitability of silicon substrates for epitaxy | Chun-Chin Tu, Zheng Lu | 2024-11-26 |