Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12214223 | Noninvasive tissue displacement control and monitoring for neuromodulation | Jeffrey Michael Ashe, Christopher Michael Puleo, Victoria Eugenia Cotero, Kirk D. Wallace, John Frederick Graf | 2025-02-04 |
| 12161888 | Ultrasonic beam path determination and targeting | David Andrew Shoudy, Jeffrey Michael Ashe, Warren Lee | 2024-12-10 |
| 11911634 | Neuromodulation energy application techniques | Christopher Michael Puleo, Yang Zhao, Kirk D. Wallace, Jeffrey Michael Ashe, David Andrew Shoudy | 2024-02-27 |
| 11633630 | Noninvasive tissue displacement control and monitoring for neuromodulation | Jeffrey Michael Ashe, Christopher Michael Puleo, Victoria Eugenia Cotero, Kirk D. Wallace, John Frederick Graf | 2023-04-25 |
| 11286849 | Ultrasonic cleaning system and method | Bernard Patrick Bewlay, Waseem Ibrahim Faidi, Peter William Lorraine, Mohamed Ahmed Ali, Siavash Yazdanfar +3 more | 2022-03-29 |
| 11235178 | Neuromodulation energy application techniques | Christopher Michael Puleo, Yang Zhao, Kirk D. Wallace, Jeffrey Michael Ashe, David Andrew Shoudy | 2022-02-01 |
| 10474897 | Smart security inspection system and method | Jia Xu, Hu Tang, Qingping Huang | 2019-11-12 |
| 10018113 | Ultrasonic cleaning system and method | Bernard Patrick Bewlay, Waseem Ibrahim Faidi, Peter William Lorraine, Mohamed Ahmed Ali, Siavash Yazdanfar +3 more | 2018-07-10 |
| 9955945 | Methods and systems for broadband intravascular ultrasound imaging | Xiang Li, Hao Lai | 2018-05-01 |
| 8715187 | Systems and methods for automatically identifying and segmenting different tissue types in ultrasound images | Cynthia Elizabeth Landberg Davis, Hae Won Lim, Gokul Swamy, Navneeth Subramanian, Nitya Subramaniam | 2014-05-06 |
| 8434936 | Method for performing ultrasonic testing | John Michael Cuffe, James Norman Barshinger | 2013-05-07 |
| 7525661 | Laser photo-thermo-acoustic (PTA) frequency swept heterodyned lock-in depth profilometry imaging system | Andreas Mandelis, Alex Vitkin, Sergey A. TELENKOV | 2009-04-28 |
| 7363098 | Method to identify machines causing excursion in semiconductor manufacturing | Choy Yow Ng | 2008-04-22 |