Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11727052 | Inspection systems and methods including image retrieval module | Xiao Bian, Bernard Patrick Bewlay, Colin J. Parris, Feng Xue, Shaopeng Liu +1 more | 2023-08-15 |
| 11301977 | Systems and methods for automatic defect recognition | Alberto Santamaria-Pang, Yousef Al-Kofahi, Aritra Chowdhury, Michael John MacDonald, Peter Arjan Wassenaar +3 more | 2022-04-12 |