Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12504346 | Leak test condition design method, leak test condition design device, leak testing method, and leak testing device | Mao HIRATA | 2025-12-23 |
| 12253436 | Method for leak testing | Tomoyuki Futami, Takaaki Watanabe | 2025-03-18 |