Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8648617 | Semiconductor device and method of testing semiconductor device | Yuji Maruyama, Tatsuhiro Mizumasa, Takayuki Nakashiro, Shigeru Gotoh, Takayuki Yano +2 more | 2014-02-11 |