Issued Patents All Time
Showing 51–65 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8264325 | Biometric authentication apparatus and biometric data registration apparatus | Mitsuaki Fukuda, Takahiro Aoki | 2012-09-11 |
| 8203614 | Image processing apparatus, image processing method, and image processing program to detect motion on images | Mitsuaki Fukuda, Takahiro Aoki | 2012-06-19 |
| 8098302 | Stain detection system | Mitsuaki Fukuda, Takahiro Aoki, Toshio Endoh | 2012-01-17 |
| 7852379 | Image forming apparatus, image forming method, and computer program product | Takahiro Aoki, Mitsuaki Fukuda | 2010-12-14 |
| 7800643 | Image obtaining apparatus | — | 2010-09-21 |
| 7783187 | Illumination controller, illumination control method, and imaging apparatus | Yutaka Katsumata, Morito Shiohara | 2010-08-24 |
| 7692137 | Reflected light detecting apparatus, reflection characteristic determining apparatus, and object detecting apparatus | Takahiro Aoki, Mitsuaki Fukuda | 2010-04-06 |
| 6944557 | Ultrasonic length measuring apparatus and method for coordinate input | Hidenori Sekiguchi, Akira Fujii | 2005-09-13 |
| 6628270 | Coordinate input apparatus | Hidenori Sekiguchi, Akira Fujii | 2003-09-30 |
| 6573699 | Device for measuring electric current by use of electro-optical crystal | Akira Fujii, Hidenori Sekiguchi, Shinichi Wakana, Toshiaki Nagai | 2003-06-03 |
| 6259244 | Electrooptic voltage waveform measuring method employing light sampling technique using Pockels effect | Shin-ichi Wakana, Akinori Miyamoto, Kazuyuki Ozaki, Toshiaki Nagai | 2001-07-10 |
| 6057677 | Electrooptic voltage waveform measuring method and apparatus | Shin-ichi Wakana, Akinori Miyamoto, Kazuyuki Ozaki, Toshiaki Nagai | 2000-05-02 |
| 5999005 | Voltage and displacement measuring apparatus and probe | Akira Fujii, Yoko Sato, Kazuyuki Ozaki, Yoshiro Goto, Yasutoshi Umehara +1 more | 1999-12-07 |
| 5677635 | Voltage and displacement measuring apparatus and probe | Akira Fujii, Yoko Sato, Kazuyuki Ozaki, Yoshiro Goto, Yasutoshi Umehara +1 more | 1997-10-14 |
| 5331275 | Probing device and system for testing an integrated circuit | Kazuyuki Ozaki, Shinichi Wakana, Yoshiro Goto, Akio Ito, Kazuo Okubo +2 more | 1994-07-19 |