| 6771543 |
Precharging scheme for reading a memory cell |
Keith H. Wong, Pau-Ling Chen |
2004-08-03 |
| 6700815 |
Refresh scheme for dynamic page programming |
Binh Quang Le, Pau-Ling Chen |
2004-03-02 |
| 6622230 |
Multi-set block erase |
Masaru Yano, Shane Hollmer |
2003-09-16 |
| 6510082 |
Drain side sensing scheme for virtual ground flash EPROM array with adjacent bit charge and hold |
Binh Quang Le, Pau-Ling Chen, Michael A. Van Buskirk, Santosh Yachareni, Kazuhiro Kurihara +1 more |
2003-01-21 |
| 6370061 |
Ceiling test mode to characterize the threshold voltage distribution of over programmed memory cells |
Santosh Yachareni, Kazuhiro Kurihara, Binh Quang Le |
2002-04-09 |
| 5995417 |
Scheme for page erase and erase verify in a non-volatile memory array |
Pau-Ling Chen, Shane Hollmer, Vincent Leung, Binh Quang Le, Masaru Yano |
1999-11-30 |
| 5978266 |
Array VSS biasing for NAND array programming reliability |
Pau-Ling Chen, Shane Hollmer, Binh Quang Le |
1999-11-02 |
| 5978267 |
Bit line biasing method to eliminate program disturbance in a non-volatile memory device and memory device employing the same |
Pau-Ling Chen, Michael A. Van Buskirk, Shane Hollmer, Binh Quang Le, Vincent Leung +2 more |
1999-11-02 |
| 5852576 |
High voltage NMOS pass gate for integrated circuit with high voltage generator and flash non-volatile memory device having the pass gate |
Binh Quang Le, Pau-Ling Chen, Shane Hollmer, Shoichi Kawamura, Vincent Leung +1 more |
1998-12-22 |
| 5801579 |
High voltage NMOS pass gate for integrated circuit with high voltage generator |
Binh Quang Le, Pau-Ling Chen, Shane Hollmer, Shoichi Kawamura, Vincent Leung +1 more |
1998-09-01 |
