Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9110140 | Scan circuit, semiconductor device, and method for testing semiconductor device | — | 2015-08-18 |
| 5754061 | Bi-CMOS circuits with enhanced power supply noise suppression and enhanced speed | Shinzou Satou, Kou Ebihara, Akiyoshi Suzuki, Keisuke Ishiwata, Hitoshi Ohmichi +2 more | 1998-05-19 |