Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12209853 | Non-contact apparatus for measuring wafer thickness | Kazutaka Shibuya, Kiyohito Aoki | 2025-01-28 |
| 6705929 | Cloth cleaning device and polishing machine | Yoshinobu Nishimoto, Makoto Nakajima, Yoshio Nakamura, Yasuhide Denda | 2004-03-16 |
| 6497047 | Flatness measuring equipment | Yoshio Nakamura | 2002-12-24 |