Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7941718 | Electronic device testing system | Robert L. Bailey | 2011-05-10 |
| 7865759 | Programmable clock control architecture for at-speed testing | Kevin Mun-Wah Chan, Brian Rust | 2011-01-04 |
| 6170078 | Fault simulation using dynamically alterable behavioral models | Mark A. Erle, Matthew C. Graf, Leendert M. Huisman | 2001-01-02 |