Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10585116 | Scanning probe microscope and method for measuring local electrical potential fields | Frank Tautz, Christian Wagner, Matthew Felix Blishen Green | 2020-03-10 |
| 8832860 | Method for measuring the force interaction that is caused by a sample | Christian Weiss, Frank Tautz | 2014-09-09 |
| 8347410 | Method for examining a sample | Sergey Subach, Frank Tautz | 2013-01-01 |