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Benoit Perron — 2 Patents

FWForensic Technology Wai: 1 patents #4 of 19Top 25%
UTUltra Electronics Forensic Technology: 1 patents #3 of 11Top 30%
Boucherville, CA: #91 of 232 inventorsTop 40%
Overall (All Time): #1,709,992 of 4,157,543Top 45%
2 Patents All Time
Benoit Perron has been granted 2 US patents while listed as an inventor at Forensic Technology Wai. The first was granted in 2014 and the most recent in July 2015. Benoit Perron ranks #1,709,992 of 4,157,543 US inventors in our database (top 41.1%). Patent records list Benoit Perron in Boucherville, QC, CA.

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9080844 Linking of microscopes for analysis of objects comprising tool marks Alain Beauchamp, Danny Roberge 2015-07-14
8817016 Generation of a modified 3D image of an object comprising tool marks Alain Beauchamp, Danny Roberge 2014-08-26

Frequent Collaborators

Alain Beauchamp2 shared
Danny Roberge2 shared

Nearby-Ranked Inventors

Leonard Mattheis2
Yiqi SHI2
Roberto DiCecco2
Haoneng Xu2
Emily Chew2
So Young Bae2
Julian Alexander Georgi2
Yoshihiro Asahara2
Assaf Ariel2