Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5598096 | Method and apparatus for testing an integrated circuit using controlled wirebonding and wirebonding removal | Cuong Pham, Brian John Hayden, Bethany J. Walles | 1997-01-28 |
PC
Peter R. Cibirka
Overall (All Time): #3,709,056 of 4,157,543Top 90%
1
Patents All Time