Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11663548 | System and method for rapid defect entry | Yang Lin, Cliff Morrison, Peter A. Couto, David W. van Heugten, Josh Reid +1 more | 2023-05-30 |
| 5047851 | Process and device for detecting and evaluating surface cracks in workpieces | Kurt Sauerwein, Hans P. Busse, Rainer Link, Helmut Wiacker, Christian Stapf +7 more | 1991-09-10 |