Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11231702 | Method, device and system for health monitoring of system-on-chip | Yiqiang Chen, Dengyun Lei, Wenxiao Fang, Bo Hou, Yuan Liu +1 more | 2022-01-25 |
| 10732216 | Method and device of remaining life prediction for electromigration failure | Yiqiang Chen, Xiaowen Zhang, Yun Huang, Yudong Lu | 2020-08-04 |
| 10598713 | ESD failure early warning circuit for integrated circuit | Yiqiang Chen, Ang Li, Dengyun Lei, Lichao Hao, Wenxiao Fang +1 more | 2020-03-24 |
| 10503578 | On-chip TDDB degradation monitoring and failure early warning circuit for SoC | Yiqiang Chen, Dengyun Lei, Wenxiao Fang, Lichao Hao, Yun Huang +2 more | 2019-12-10 |
| 10458823 | System and method for health monitoring and early warning for electronic device | Yiqiang Chen, Yun Huang, Dengyun Lei, Yudong Lu, Chunhua He +1 more | 2019-10-29 |
| 10191480 | Method and system of close-loop analysis to electronic component fault problem | Xiaoqi He, Ping-Wen Lai, Yuan Chen, Yunhui Wang | 2019-01-29 |
| 9952275 | Method and device of remaining life prediction for electromigration failure | Yiqiang Chen, Xiaowen Zhang, Yun Huang, Yudong Lu | 2018-04-24 |
| 9430315 | Method and system for constructing component fault tree based on physics of failure | Xiaoqi He, Yuan Chen, Fangfang Song, Jingdong Feng, Yunhui Wang | 2016-08-30 |
| 9329228 | Prognostic circuit of electromigration failure for integrated circuit | Yiqiang Chen, Yun Huang, Yudong Lu, Qingzhong Xiao | 2016-05-03 |