YC

Yiqiang Chen

SC Shenzhen Yinwang Intelligent Technologies Co.: 1 patents #52 of 185Top 30%
ST South China University Of Technology: 1 patents #245 of 947Top 30%
📍 Lo Wu, CN: #748 of 7,906 inventorsTop 10%
Overall (All Time): #394,625 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
12339310 Method for monitoring degradation mechanism of switch device in power conversion circuit Haofan Long, Bo Hou, Changjian Zhou 2025-06-24
12340593 Vehicle drivable area detection method, system, and autonomous vehicle using the system Lang Xia, Yujie Shen 2025-06-24
12301097 Fault prediction method and apparatus for power conversion device, and power conversion system Yihang Lin, Bo Hou, Dazhi Wang, Shuo Zhang, Xiangzhen Cai 2025-05-13
12241948 Asymmetric compensation method and apparatus for two-port near field probe, computer device, and storage medium Weiheng Shao, Yinghui Chen, Changjian Zhou 2025-03-04
12066468 Method and device for detecting system failure, computer device, and storage medium Bo Hou, Yihang Lin, Dazhi Wang, Shuo Zhang, Haipin Wu 2024-08-20
11231702 Method, device and system for health monitoring of system-on-chip Dengyun Lei, Yunfei En, Wenxiao Fang, Bo Hou, Yuan Liu +1 more 2022-01-25
10732216 Method and device of remaining life prediction for electromigration failure Yunfei En, Xiaowen Zhang, Yun Huang, Yudong Lu 2020-08-04
10598713 ESD failure early warning circuit for integrated circuit Ang Li, Dengyun Lei, Yunfei En, Lichao Hao, Wenxiao Fang +1 more 2020-03-24
10503578 On-chip TDDB degradation monitoring and failure early warning circuit for SoC Dengyun Lei, Yunfei En, Wenxiao Fang, Lichao Hao, Yun Huang +2 more 2019-12-10
10458823 System and method for health monitoring and early warning for electronic device Yun Huang, Dengyun Lei, Yudong Lu, Yunfei En, Chunhua He +1 more 2019-10-29
9952275 Method and device of remaining life prediction for electromigration failure Yunfei En, Xiaowen Zhang, Yun Huang, Yudong Lu 2018-04-24
9329228 Prognostic circuit of electromigration failure for integrated circuit Yunfei En, Yun Huang, Yudong Lu, Qingzhong Xiao 2016-05-03